New Numerical Method to Calculate the True Optical Absorption of Hydrogenated Nanocrystalline Silicon Thin Films

New Numerical Method to Calculate the True Optical Absorption of Hydrogenated Nanocrystalline Silicon Thin Films

The enhanced optical absorption measured by Constant Photocurrent Method (CPM) of hydrogenated nanocrystalline silicon thin films is due mainly to bulk and/or surface light scattering effects. A new numerical method is presented to calculate both true optical absorption and scattering coefficient fr...

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Veröffentlicht in:World journal of nano science and engineering 2012-03, Vol.2 (1), p.1-5
Hauptverfasser: Besahraoui, Fatiha, Chahed, Larbi, Bouizem, Yahia, Sib, Jamal Dine
Format: Artikel
Sprache:eng
Schlagworte:
Mathematical analysis
Nanocomposites
Nanocrystals
Nanomaterials
Nanostructure
Silicon films
Surface chemistry
Thin films
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Zusammenfassung:The enhanced optical absorption measured by Constant Photocurrent Method (CPM) of hydrogenated nanocrystalline silicon thin films is due mainly to bulk and/or surface light scattering effects. A new numerical method is presented to calculate both true optical absorption and scattering coefficient from CPM absorption spectra of nanotextured nano-crystalline silicon films. Bulk and surface light scattering contributions can be unified through the correlation obtained between the scattering coefficient and surface roughness obtained using our method.
ISSN:2161-4954
2161-4962
DOI:10.4236/wjnse.2012.21001