Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity

Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity

We studied the distribution of glass transition temperature (Tg) through neutron reflectivity in a poly(methyl methacrylate) (PMMA) thin film supported on a silicon substrate with a five-layered PMMA thin film consisting of deuterated-PMMA and hydrogenated-PMMA. The depth distribution of Tg was succ...

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Veröffentlicht in:Physical review. E, Statistical, nonlinear, and soft matter physics Statistical, nonlinear, and soft matter physics, 2013-09, Vol.88 (3), p.032601-032601, Article 032601
Hauptverfasser: Inoue, Rintaro, Nakamura, Makoto, Matsui, Kazuya, Kanaya, Toshiji, Nishida, Koji, Hino, Masahiro
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container_title Physical review. E, Statistical, nonlinear, and soft matter physics
container_volume 88
creator Inoue, Rintaro
Nakamura, Makoto
Matsui, Kazuya
Kanaya, Toshiji
Nishida, Koji
Hino, Masahiro
description We studied the distribution of glass transition temperature (Tg) through neutron reflectivity in a poly(methyl methacrylate) (PMMA) thin film supported on a silicon substrate with a five-layered PMMA thin film consisting of deuterated-PMMA and hydrogenated-PMMA. The depth distribution of Tg was successfully observed in the PMMA thin film. Compared to the previously reported distribution of Tg in a polystyrene thin film, the presence of a long-range interfacial effect, supposedly caused by an interaction between PMMA and the substrate, is considered to be responsible for the differences in both the distribution of Tg and the thickness dependence of Tg in both polymers. Therefore, it is expected that the thickness dependence of Tg reported for single-layered polymer thin films can, in principle, be understood from the viewpoint of the difference in the depth distribution of Tg.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1461875293</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1461875293</sourcerecordid><originalsourceid>FETCH-LOGICAL-c369t-b69c64924efbb5ea79970b0c01d8561916a985409fb0851fa7d3b2449fdb02213</originalsourceid><addsrcrecordid>eNo9kcluFDEQhi1ERELgBTggH8OhJ17abvuIkrBIkRKxnFt2d5kxci94GamfhlfFwwROVar66q_Dh9AbSnaUEn697rcU4QA7pXaEM0noM3RBhSAN4518fuy5bngnxDl6mdJPUiGu2hfonLWUCabkBfp961OO3pbslxkvDv8IJiWco5mT_zvLMK0QTS4RsJ_xVEL2wWwQYcTrErarCfJ-C_hYzBC3YDK8w3lfWefDhFNZ1yXmStcwg7_6OrH1Z8WwSTjlMvq6tBueoeRYoQguwJD9weftFTpzJiR4_VQv0fcPd99uPjX3Dx8_37y_bwYudW6s1INsNWvBWSvAdFp3xJKB0FEJSTWVRivREu0sUYI6043csrbVbrSEMcov0dUpd43LrwIp95NPA4RgZlhK6mkrqeoE07yi7IQOcUlVgOvX6CcTt56S_iimf6xivsDhrleqP4mpR2-f8oudYPx_8s8E_wMAY4_0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1461875293</pqid></control><display><type>article</type><title>Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity</title><source>American Physical Society Journals</source><creator>Inoue, Rintaro ; Nakamura, Makoto ; Matsui, Kazuya ; Kanaya, Toshiji ; Nishida, Koji ; Hino, Masahiro</creator><creatorcontrib>Inoue, Rintaro ; Nakamura, Makoto ; Matsui, Kazuya ; Kanaya, Toshiji ; Nishida, Koji ; Hino, Masahiro</creatorcontrib><description>We studied the distribution of glass transition temperature (Tg) through neutron reflectivity in a poly(methyl methacrylate) (PMMA) thin film supported on a silicon substrate with a five-layered PMMA thin film consisting of deuterated-PMMA and hydrogenated-PMMA. The depth distribution of Tg was successfully observed in the PMMA thin film. Compared to the previously reported distribution of Tg in a polystyrene thin film, the presence of a long-range interfacial effect, supposedly caused by an interaction between PMMA and the substrate, is considered to be responsible for the differences in both the distribution of Tg and the thickness dependence of Tg in both polymers. Therefore, it is expected that the thickness dependence of Tg reported for single-layered polymer thin films can, in principle, be understood from the viewpoint of the difference in the depth distribution of Tg.</description><identifier>ISSN: 1539-3755</identifier><identifier>EISSN: 1550-2376</identifier><identifier>DOI: 10.1103/physreve.88.032601</identifier><identifier>PMID: 24125286</identifier><language>eng</language><publisher>United States</publisher><ispartof>Physical review. E, Statistical, nonlinear, and soft matter physics, 2013-09, Vol.88 (3), p.032601-032601, Article 032601</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-b69c64924efbb5ea79970b0c01d8561916a985409fb0851fa7d3b2449fdb02213</citedby><cites>FETCH-LOGICAL-c369t-b69c64924efbb5ea79970b0c01d8561916a985409fb0851fa7d3b2449fdb02213</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,2863,2864,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/24125286$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Inoue, Rintaro</creatorcontrib><creatorcontrib>Nakamura, Makoto</creatorcontrib><creatorcontrib>Matsui, Kazuya</creatorcontrib><creatorcontrib>Kanaya, Toshiji</creatorcontrib><creatorcontrib>Nishida, Koji</creatorcontrib><creatorcontrib>Hino, Masahiro</creatorcontrib><title>Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity</title><title>Physical review. E, Statistical, nonlinear, and soft matter physics</title><addtitle>Phys Rev E Stat Nonlin Soft Matter Phys</addtitle><description>We studied the distribution of glass transition temperature (Tg) through neutron reflectivity in a poly(methyl methacrylate) (PMMA) thin film supported on a silicon substrate with a five-layered PMMA thin film consisting of deuterated-PMMA and hydrogenated-PMMA. The depth distribution of Tg was successfully observed in the PMMA thin film. Compared to the previously reported distribution of Tg in a polystyrene thin film, the presence of a long-range interfacial effect, supposedly caused by an interaction between PMMA and the substrate, is considered to be responsible for the differences in both the distribution of Tg and the thickness dependence of Tg in both polymers. Therefore, it is expected that the thickness dependence of Tg reported for single-layered polymer thin films can, in principle, be understood from the viewpoint of the difference in the depth distribution of Tg.</description><issn>1539-3755</issn><issn>1550-2376</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNo9kcluFDEQhi1ERELgBTggH8OhJ17abvuIkrBIkRKxnFt2d5kxci94GamfhlfFwwROVar66q_Dh9AbSnaUEn697rcU4QA7pXaEM0noM3RBhSAN4518fuy5bngnxDl6mdJPUiGu2hfonLWUCabkBfp961OO3pbslxkvDv8IJiWco5mT_zvLMK0QTS4RsJ_xVEL2wWwQYcTrErarCfJ-C_hYzBC3YDK8w3lfWefDhFNZ1yXmStcwg7_6OrH1Z8WwSTjlMvq6tBueoeRYoQguwJD9weftFTpzJiR4_VQv0fcPd99uPjX3Dx8_37y_bwYudW6s1INsNWvBWSvAdFp3xJKB0FEJSTWVRivREu0sUYI6043csrbVbrSEMcov0dUpd43LrwIp95NPA4RgZlhK6mkrqeoE07yi7IQOcUlVgOvX6CcTt56S_iimf6xivsDhrleqP4mpR2-f8oudYPx_8s8E_wMAY4_0</recordid><startdate>20130906</startdate><enddate>20130906</enddate><creator>Inoue, Rintaro</creator><creator>Nakamura, Makoto</creator><creator>Matsui, Kazuya</creator><creator>Kanaya, Toshiji</creator><creator>Nishida, Koji</creator><creator>Hino, Masahiro</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20130906</creationdate><title>Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity</title><author>Inoue, Rintaro ; Nakamura, Makoto ; Matsui, Kazuya ; Kanaya, Toshiji ; Nishida, Koji ; Hino, Masahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-b69c64924efbb5ea79970b0c01d8561916a985409fb0851fa7d3b2449fdb02213</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Inoue, Rintaro</creatorcontrib><creatorcontrib>Nakamura, Makoto</creatorcontrib><creatorcontrib>Matsui, Kazuya</creatorcontrib><creatorcontrib>Kanaya, Toshiji</creatorcontrib><creatorcontrib>Nishida, Koji</creatorcontrib><creatorcontrib>Hino, Masahiro</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Physical review. E, Statistical, nonlinear, and soft matter physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Inoue, Rintaro</au><au>Nakamura, Makoto</au><au>Matsui, Kazuya</au><au>Kanaya, Toshiji</au><au>Nishida, Koji</au><au>Hino, Masahiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity</atitle><jtitle>Physical review. E, Statistical, nonlinear, and soft matter physics</jtitle><addtitle>Phys Rev E Stat Nonlin Soft Matter Phys</addtitle><date>2013-09-06</date><risdate>2013</risdate><volume>88</volume><issue>3</issue><spage>032601</spage><epage>032601</epage><pages>032601-032601</pages><artnum>032601</artnum><issn>1539-3755</issn><eissn>1550-2376</eissn><abstract>We studied the distribution of glass transition temperature (Tg) through neutron reflectivity in a poly(methyl methacrylate) (PMMA) thin film supported on a silicon substrate with a five-layered PMMA thin film consisting of deuterated-PMMA and hydrogenated-PMMA. The depth distribution of Tg was successfully observed in the PMMA thin film. Compared to the previously reported distribution of Tg in a polystyrene thin film, the presence of a long-range interfacial effect, supposedly caused by an interaction between PMMA and the substrate, is considered to be responsible for the differences in both the distribution of Tg and the thickness dependence of Tg in both polymers. Therefore, it is expected that the thickness dependence of Tg reported for single-layered polymer thin films can, in principle, be understood from the viewpoint of the difference in the depth distribution of Tg.</abstract><cop>United States</cop><pmid>24125286</pmid><doi>10.1103/physreve.88.032601</doi><tpages>1</tpages></addata></record>
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title Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T04%3A38%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Distribution%20of%20glass%20transition%20temperature%20in%20multilayered%20poly(methyl%20methacrylate)%20thin%20film%20supported%20on%20a%20Si%20substrate%20as%20studied%20by%20neutron%20reflectivity&rft.jtitle=Physical%20review.%20E,%20Statistical,%20nonlinear,%20and%20soft%20matter%20physics&rft.au=Inoue,%20Rintaro&rft.date=2013-09-06&rft.volume=88&rft.issue=3&rft.spage=032601&rft.epage=032601&rft.pages=032601-032601&rft.artnum=032601&rft.issn=1539-3755&rft.eissn=1550-2376&rft_id=info:doi/10.1103/physreve.88.032601&rft_dat=%3Cproquest_cross%3E1461875293%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1461875293&rft_id=info:pmid/24125286&rfr_iscdi=true