Review on microstructure evolution in Sn–Ag–Cu solders and its effect on mechanical integrity of solder joints
The use of Pb-bearing solders in electronic assemblies is avoided in many countries due to the inherent toxicity and environmental risks associated with lead. Although a number of “Pb-free” alloys have been invented, none of them meet all the standards generally satisfied by a conventional Pb–Sn all...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2013-09, Vol.24 (9), p.3149-3169 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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