Review on microstructure evolution in Sn–Ag–Cu solders and its effect on mechanical integrity of solder joints

The use of Pb-bearing solders in electronic assemblies is avoided in many countries due to the inherent toxicity and environmental risks associated with lead. Although a number of “Pb-free” alloys have been invented, none of them meet all the standards generally satisfied by a conventional Pb–Sn all...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2013-09, Vol.24 (9), p.3149-3169
Hauptverfasser: Sona, Mrunali, Prabhu, K. N.
Format: Artikel
Sprache:eng
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