Positron Energy Levels in Cd-Based Semiconductors

Using the full potential linearized augmented plane wave FP-LAPW method within local density ap- proximation LDA, we have studied positron diffusion and surface emission in Cd-based semiconductors. This requires the calculation of electron and positron band structures. In the absence of experimental...

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Veröffentlicht in:Communications in theoretical physics 2013-06, Vol.59 (6), p.756-762
Hauptverfasser: Abbar, B, Mecabih, S, Amari, S, Bcnosman, N, Bouhafs, B
Format: Artikel
Sprache:eng
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Zusammenfassung:Using the full potential linearized augmented plane wave FP-LAPW method within local density ap- proximation LDA, we have studied positron diffusion and surface emission in Cd-based semiconductors. This requires the calculation of electron and positron band structures. In the absence of experimental and theoretical data for CdX (X=S, Se, Te) we have treated the Si, which has been studied by several authors, as a test case. Predictive results on positron effective masses, deformation potentials, positron work functions, diffusion constants and positron mobilities are presented for CdX (X=S, Se, Te). Our calculated data for Si are compared with experimental and recent theoretical results.
ISSN:0253-6102
DOI:10.1088/0253-6102/59/6/18