From substrate disorder to contact angle hysteresis, and back

Based on Monte Carlo simulation of the contact line as a long-range elastic model, we develop tools relating substrate traps, trapping time and trapping length. We demonstrate the possibility of retrieving some information on the substrate topography from measurements of contact line motion, near th...

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Veröffentlicht in:Colloid and polymer science 2013-02, Vol.291 (2), p.291-298
Hauptverfasser: Collet, Pierre, De Coninck, Joël, Drouiche, Karim, Dunlop, François
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container_title Colloid and polymer science
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creator Collet, Pierre
De Coninck, Joël
Drouiche, Karim
Dunlop, François
description Based on Monte Carlo simulation of the contact line as a long-range elastic model, we develop tools relating substrate traps, trapping time and trapping length. We demonstrate the possibility of retrieving some information on the substrate topography from measurements of contact line motion, near the threshold in forced spreading or near the advancing angle in spontaneous spreading.
doi_str_mv 10.1007/s00396-012-2839-z
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subjects Characterization and Evaluation of Materials
Chemistry
Chemistry and Materials Science
Complex Fluids and Microfluidics
Computer simulation
Contact
Contact angle
Contact Angle Hysteresis
Disorders
Food Science
Hysteresis
Nanotechnology and Microengineering
Original Contribution
Physical Chemistry
Polymer Sciences
Soft and Granular Matter
Spreading
Topography
Trapping
title From substrate disorder to contact angle hysteresis, and back
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