From substrate disorder to contact angle hysteresis, and back

Based on Monte Carlo simulation of the contact line as a long-range elastic model, we develop tools relating substrate traps, trapping time and trapping length. We demonstrate the possibility of retrieving some information on the substrate topography from measurements of contact line motion, near th...

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Veröffentlicht in:	Colloid and polymer science 2013-02, Vol.291 (2), p.291-298
Hauptverfasser:	Collet, Pierre, De Coninck, Joël, Drouiche, Karim, Dunlop, François
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry Chemistry and Materials Science Complex Fluids and Microfluidics Computer simulation Contact Contact angle Contact Angle Hysteresis Disorders Food Science Hysteresis Nanotechnology and Microengineering Original Contribution Physical Chemistry Polymer Sciences Soft and Granular Matter Spreading Topography Trapping
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Beschreibung
Zusammenfassung:	Based on Monte Carlo simulation of the contact line as a long-range elastic model, we develop tools relating substrate traps, trapping time and trapping length. We demonstrate the possibility of retrieving some information on the substrate topography from measurements of contact line motion, near the threshold in forced spreading or near the advancing angle in spontaneous spreading.
ISSN:	0303-402X 1435-1536
DOI:	10.1007/s00396-012-2839-z