Characterization of magnetostatic surface spin waves in magnetic thin films: evaluation for microelectronic applications

The authors have investigated the possibility of utilizing spin waves for interchip and intrachip communications, and as logic elements using both simulations and experimental techniques. Through simulations it has been shown that the decay lengths of magnetostatic spin waves are affected most by th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2013-05, Vol.111 (2), p.369-378
Hauptverfasser: Kwon, Jae Hyun, Mukherjee, Sankha Subhra, Deorani, Praveen, Hayashi, Masamitsu, Yang, Hyunsoo
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The authors have investigated the possibility of utilizing spin waves for interchip and intrachip communications, and as logic elements using both simulations and experimental techniques. Through simulations it has been shown that the decay lengths of magnetostatic spin waves are affected most by the damping parameter, and least by the exchange stiffness constant. The damping and dispersion properties of spin waves limit the attenuation length to several tens of microns. Thus, we have ruled out the possibility of interchip communication via spin waves. Experimental techniques for the extraction of the dispersion relationship have also been demonstrated, along with experimental demonstrations of spin wave interference for amplitude modulation. The effectiveness of spin wave modulation through interference, along with the capability of determining the spin wave dispersion relationships electrically during the manufacturing and testing phase of chip production, may pave the way for using spin waves in analog computing wherein the circuitry required for performing similar functionality becomes prohibitive.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-012-7542-x