Correlative light-electron fractography for fatigue striations characterization in metallic alloys
ABSTRACT The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and lar...
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| Veröffentlicht in: | Microscopy research and technique 2013-09, Vol.76 (9), p.909-913 |
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| container_title | Microscopy research and technique |
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| creator | Hein, Luis Rogerio de Oliveira de Oliveira, José Alberto de Campos, Kamila Amato |
| description | ABSTRACT
The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. Tech. 76:909–913, 2013. © 2013 Wiley Periodicals, Inc. |
| doi_str_mv | 10.1002/jemt.22247 |
| format | Article |
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The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. Tech. 76:909–913, 2013. © 2013 Wiley Periodicals, Inc.</description><identifier>ISSN: 1059-910X</identifier><identifier>EISSN: 1097-0029</identifier><identifier>DOI: 10.1002/jemt.22247</identifier><identifier>PMID: 23813591</identifier><identifier>CODEN: MRTEEO</identifier><language>eng</language><publisher>United States: Blackwell Publishing Ltd</publisher><subject>3D reconstruction ; fatigue ; fractography ; optical microscopy ; scanning electron microscopy (SEM)</subject><ispartof>Microscopy research and technique, 2013-09, Vol.76 (9), p.909-913</ispartof><rights>Copyright © 2013 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3957-9aeca976f282d47de6d224de62fb017c4fb4fd0544b90424c672fa56d87849e03</citedby><cites>FETCH-LOGICAL-c3957-9aeca976f282d47de6d224de62fb017c4fb4fd0544b90424c672fa56d87849e03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fjemt.22247$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fjemt.22247$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>315,781,785,1418,27928,27929,45578,45579</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/23813591$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Hein, Luis Rogerio de Oliveira</creatorcontrib><creatorcontrib>de Oliveira, José Alberto</creatorcontrib><creatorcontrib>de Campos, Kamila Amato</creatorcontrib><title>Correlative light-electron fractography for fatigue striations characterization in metallic alloys</title><title>Microscopy research and technique</title><addtitle>Microsc. Res. Tech</addtitle><description>ABSTRACT
The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. 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The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. Tech. 76:909–913, 2013. © 2013 Wiley Periodicals, Inc.</abstract><cop>United States</cop><pub>Blackwell Publishing Ltd</pub><pmid>23813591</pmid><doi>10.1002/jemt.22247</doi><tpages>5</tpages></addata></record> |
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| subjects | 3D reconstruction fatigue fractography optical microscopy scanning electron microscopy (SEM) |
| title | Correlative light-electron fractography for fatigue striations characterization in metallic alloys |
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