Correlative light-electron fractography for fatigue striations characterization in metallic alloys

ABSTRACT The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and lar...

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Veröffentlicht in:Microscopy research and technique 2013-09, Vol.76 (9), p.909-913
Hauptverfasser: Hein, Luis Rogerio de Oliveira, de Oliveira, José Alberto, de Campos, Kamila Amato
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Sprache:eng
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Zusammenfassung:ABSTRACT The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. Tech. 76:909–913, 2013. © 2013 Wiley Periodicals, Inc.
ISSN:1059-910X
1097-0029
DOI:10.1002/jemt.22247