Analysis of triangular resonator integrated with zinc oxide thin film
We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference tim...
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Veröffentlicht in: | Optical and quantum electronics 2013-07, Vol.45 (7), p.755-760 |
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container_title | Optical and quantum electronics |
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creator | Kim, Seon Hoon Oh, Geum-Yoon Kim, Doo Gun Ki, Hyun Chul Kim, Tae Un Kim, Hwe Jong |
description | We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference time-domain method as a function of refractive index change of ZnO thin film. The wavelength of resonance was shifted about 0.002 nm when the change of refractive index of zinc oxide thin film was 0.01. |
doi_str_mv | 10.1007/s11082-013-9657-5 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1429887607</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1429887607</sourcerecordid><originalsourceid>FETCH-LOGICAL-c273t-3996095aa8e0ce7140530b3d9bf58451319706300f10dc43acf4b5a0122a654b3</originalsourceid><addsrcrecordid>eNp9kL1OwzAURi0EEqXwAGweWQz3xnEcj1VVfqRKLCCxWU7itK5Sp9iOoDw9qcLM9C3nfMMh5BbhHgHkQ0SEMmOAnKlCSCbOyAyFzFiJ8uOczIBDwUqF6pJcxbgDgCIXMCOrhTfdMbpI-5am4IzfDJ0JNNjYe5P6QJ1PdhNMsg39cmlLf5yvaf_tGkvT1nnaum5_TS5a00V787dz8v64els-s_Xr08tysWZ1JnliXKkClDCmtFBbiTkIDhVvVNWKMhfIUUkoOECL0NQ5N3WbV8IAZpkpRF7xObmbfg-h_xxsTHrvYm27znjbD1FjnqmylAXIEcUJrUMfY7CtPgS3N-GoEfQpmZ6S6TGZPiXTYnSyyYkj6zc26F0_hDFQ_Ef6BZvFbd8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1429887607</pqid></control><display><type>article</type><title>Analysis of triangular resonator integrated with zinc oxide thin film</title><source>SpringerLink Journals - AutoHoldings</source><creator>Kim, Seon Hoon ; Oh, Geum-Yoon ; Kim, Doo Gun ; Ki, Hyun Chul ; Kim, Tae Un ; Kim, Hwe Jong</creator><creatorcontrib>Kim, Seon Hoon ; Oh, Geum-Yoon ; Kim, Doo Gun ; Ki, Hyun Chul ; Kim, Tae Un ; Kim, Hwe Jong</creatorcontrib><description>We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference time-domain method as a function of refractive index change of ZnO thin film. The wavelength of resonance was shifted about 0.002 nm when the change of refractive index of zinc oxide thin film was 0.01.</description><identifier>ISSN: 0306-8919</identifier><identifier>EISSN: 1572-817X</identifier><identifier>DOI: 10.1007/s11082-013-9657-5</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Computer Communication Networks ; Electrical Engineering ; Finite difference method ; Lasers ; Mathematical analysis ; Optical Devices ; Optics ; Photonics ; Physics ; Physics and Astronomy ; Refractive index ; Refractivity ; Resonators ; Thin films ; Wavelengths ; Zinc oxide</subject><ispartof>Optical and quantum electronics, 2013-07, Vol.45 (7), p.755-760</ispartof><rights>Springer Science+Business Media New York 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c273t-3996095aa8e0ce7140530b3d9bf58451319706300f10dc43acf4b5a0122a654b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11082-013-9657-5$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11082-013-9657-5$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27923,27924,41487,42556,51318</link.rule.ids></links><search><creatorcontrib>Kim, Seon Hoon</creatorcontrib><creatorcontrib>Oh, Geum-Yoon</creatorcontrib><creatorcontrib>Kim, Doo Gun</creatorcontrib><creatorcontrib>Ki, Hyun Chul</creatorcontrib><creatorcontrib>Kim, Tae Un</creatorcontrib><creatorcontrib>Kim, Hwe Jong</creatorcontrib><title>Analysis of triangular resonator integrated with zinc oxide thin film</title><title>Optical and quantum electronics</title><addtitle>Opt Quant Electron</addtitle><description>We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference time-domain method as a function of refractive index change of ZnO thin film. The wavelength of resonance was shifted about 0.002 nm when the change of refractive index of zinc oxide thin film was 0.01.</description><subject>Characterization and Evaluation of Materials</subject><subject>Computer Communication Networks</subject><subject>Electrical Engineering</subject><subject>Finite difference method</subject><subject>Lasers</subject><subject>Mathematical analysis</subject><subject>Optical Devices</subject><subject>Optics</subject><subject>Photonics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Refractive index</subject><subject>Refractivity</subject><subject>Resonators</subject><subject>Thin films</subject><subject>Wavelengths</subject><subject>Zinc oxide</subject><issn>0306-8919</issn><issn>1572-817X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp9kL1OwzAURi0EEqXwAGweWQz3xnEcj1VVfqRKLCCxWU7itK5Sp9iOoDw9qcLM9C3nfMMh5BbhHgHkQ0SEMmOAnKlCSCbOyAyFzFiJ8uOczIBDwUqF6pJcxbgDgCIXMCOrhTfdMbpI-5am4IzfDJ0JNNjYe5P6QJ1PdhNMsg39cmlLf5yvaf_tGkvT1nnaum5_TS5a00V787dz8v64els-s_Xr08tysWZ1JnliXKkClDCmtFBbiTkIDhVvVNWKMhfIUUkoOECL0NQ5N3WbV8IAZpkpRF7xObmbfg-h_xxsTHrvYm27znjbD1FjnqmylAXIEcUJrUMfY7CtPgS3N-GoEfQpmZ6S6TGZPiXTYnSyyYkj6zc26F0_hDFQ_Ef6BZvFbd8</recordid><startdate>20130701</startdate><enddate>20130701</enddate><creator>Kim, Seon Hoon</creator><creator>Oh, Geum-Yoon</creator><creator>Kim, Doo Gun</creator><creator>Ki, Hyun Chul</creator><creator>Kim, Tae Un</creator><creator>Kim, Hwe Jong</creator><general>Springer US</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20130701</creationdate><title>Analysis of triangular resonator integrated with zinc oxide thin film</title><author>Kim, Seon Hoon ; Oh, Geum-Yoon ; Kim, Doo Gun ; Ki, Hyun Chul ; Kim, Tae Un ; Kim, Hwe Jong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-3996095aa8e0ce7140530b3d9bf58451319706300f10dc43acf4b5a0122a654b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Computer Communication Networks</topic><topic>Electrical Engineering</topic><topic>Finite difference method</topic><topic>Lasers</topic><topic>Mathematical analysis</topic><topic>Optical Devices</topic><topic>Optics</topic><topic>Photonics</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Refractive index</topic><topic>Refractivity</topic><topic>Resonators</topic><topic>Thin films</topic><topic>Wavelengths</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Seon Hoon</creatorcontrib><creatorcontrib>Oh, Geum-Yoon</creatorcontrib><creatorcontrib>Kim, Doo Gun</creatorcontrib><creatorcontrib>Ki, Hyun Chul</creatorcontrib><creatorcontrib>Kim, Tae Un</creatorcontrib><creatorcontrib>Kim, Hwe Jong</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Optical and quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Seon Hoon</au><au>Oh, Geum-Yoon</au><au>Kim, Doo Gun</au><au>Ki, Hyun Chul</au><au>Kim, Tae Un</au><au>Kim, Hwe Jong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of triangular resonator integrated with zinc oxide thin film</atitle><jtitle>Optical and quantum electronics</jtitle><stitle>Opt Quant Electron</stitle><date>2013-07-01</date><risdate>2013</risdate><volume>45</volume><issue>7</issue><spage>755</spage><epage>760</epage><pages>755-760</pages><issn>0306-8919</issn><eissn>1572-817X</eissn><abstract>We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference time-domain method as a function of refractive index change of ZnO thin film. The wavelength of resonance was shifted about 0.002 nm when the change of refractive index of zinc oxide thin film was 0.01.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11082-013-9657-5</doi><tpages>6</tpages></addata></record> |
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subjects | Characterization and Evaluation of Materials Computer Communication Networks Electrical Engineering Finite difference method Lasers Mathematical analysis Optical Devices Optics Photonics Physics Physics and Astronomy Refractive index Refractivity Resonators Thin films Wavelengths Zinc oxide |
title | Analysis of triangular resonator integrated with zinc oxide thin film |
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