Analysis of triangular resonator integrated with zinc oxide thin film

Analysis of triangular resonator integrated with zinc oxide thin film

We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference tim...

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Veröffentlicht in:Optical and quantum electronics 2013-07, Vol.45 (7), p.755-760
Hauptverfasser: Kim, Seon Hoon, Oh, Geum-Yoon, Kim, Doo Gun, Ki, Hyun Chul, Kim, Tae Un, Kim, Hwe Jong
Format: Artikel
Sprache:eng
Schlagworte:
Characterization and Evaluation of Materials
Computer Communication Networks
Electrical Engineering
Finite difference method
Lasers
Mathematical analysis
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
Refractive index
Refractivity
Resonators
Thin films
Wavelengths
Zinc oxide
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Zusammenfassung:We proposed triangular resonator integrated with zinc oxide (ZnO) thin film. With assumption that ZnO thin film grown by low temperature hydrothermal method was placed on the over-cladding of the triangular resonator region, the propagation characteristic was analyzed using 2-D finite-difference time-domain method as a function of refractive index change of ZnO thin film. The wavelength of resonance was shifted about 0.002 nm when the change of refractive index of zinc oxide thin film was 0.01.
ISSN:0306-8919
1572-817X
DOI:10.1007/s11082-013-9657-5