Optical Methods in Orientation of High-Purity Germanium Crystal

Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal...

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Veröffentlicht in:Journal of crystallization process and technology 2013-04, Vol.3 (2), p.60-63
Hauptverfasser: Wang, Guojian, Sun, Yongchen, Guan, Yutong, Mei, Dongming, Yang, Gang, Chiller, Angela Alanson, Gray, Bruce
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Sprache:eng
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Zusammenfassung:Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05 degree - 0.12 degree . The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals.
ISSN:2161-7678
2161-7686
DOI:10.4236/jcpt.2013.32009