Predicting the Interface Morphologies of Silicon Films on Arbitrary Substrates: Application in Solar Cells

A three-dimensional model that predicts the interface morphologies of silicon thin-film solar cells prepared on randomly textured substrates was developed and compared to experimental data. The surface morphologies of silicon solar cells were calculated by using atomic force microscope scans of the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:ACS applied materials & interfaces 2013-08, Vol.5 (15), p.7109-7116
Hauptverfasser: Jovanov, Vladislav, Xu, Xu, Shrestha, Shailesh, Schulte, Melanie, Hüpkes, Jürgen, Knipp, Dietmar
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A three-dimensional model that predicts the interface morphologies of silicon thin-film solar cells prepared on randomly textured substrates was developed and compared to experimental data. The surface morphologies of silicon solar cells were calculated by using atomic force microscope scans of the textured substrates and the film thickness as input data. Calculated surface morphologies of silicon solar cells are in good agreement with experimentally measured morphologies. A detailed description of the solar cell interface morphologies is necessary to understand light-trapping in silicon single junction and micromorph tandem thin-film solar cells and derive optimal light-trapping structures.
ISSN:1944-8244
1944-8252
DOI:10.1021/am401434y