2.8??m emission from type-I quantum wells grown on InAsxP1?x/InP metamorphic graded buffers

We report 2.8 mu m emission from compressively strained type-I quantum wells (QWs) grown on InP-based metamorphic InAsxP1-x step-graded buffers. High quality metamorphic graded buffers showed smooth surface morphology and low threading dislocation densities of approximately 2.5 106 cm-2. High-resolu...

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Veröffentlicht in:Applied physics letters 2012-01, Vol.101 (25)
Hauptverfasser: Jung, Daehwan, Song, Yuncheng, Yu, Lan, Wasserman, Daniel, Larry Lee, Minjoo
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container_title Applied physics letters
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creator Jung, Daehwan
Song, Yuncheng
Yu, Lan
Wasserman, Daniel
Larry Lee, Minjoo
description We report 2.8 mu m emission from compressively strained type-I quantum wells (QWs) grown on InP-based metamorphic InAsxP1-x step-graded buffers. High quality metamorphic graded buffers showed smooth surface morphology and low threading dislocation densities of approximately 2.5 106 cm-2. High-resolution x-ray diffraction scans showed strong satellites from multiple quantum wells grown on metamorphic buffers, and cross-sectional transmission electron microscopy revealed smooth and coherent quantum well interfaces. Room-temperature photoluminescence emission at 2.8 mu m with a narrow linewidth ( similar to 50 meV) shows the promise of metamorphic growth for mid-infrared laser diodes on InP.
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source AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection
subjects Buffers
Cross sections
Density
Emission
Indium phosphides
Metamorphic
Quantum wells
Threading dislocations
title 2.8??m emission from type-I quantum wells grown on InAsxP1?x/InP metamorphic graded buffers
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