Calibration of nonspherical particles in optical tweezers using only position measurement

Calibration of nonspherical particles in optical tweezers using only position measurement

Nonspherical probe particles are an attractive choice for optically-trapped scanning probe microscopy. We show that it is possible to calibrate a trap with a nonspherical particle using only position measurements, without requiring measurement of orientation, using a pseudopotential based on the pos...

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Veröffentlicht in:Optics letters 2013-04, Vol.38 (8), p.1244-1246
Hauptverfasser: Bui, Ann A M, Stilgoe, Alexander B, Nieminen, Timo A, Rubinsztein-Dunlop, Halina
Format: Artikel
Sprache:eng
Schlagworte:
Calibration
Displacement
Models, Theoretical
Occupation
Optical Tweezers
Orientation
Position measurement
Pseudopotentials
Scanning probe microscopy
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Beschreibung
Zusammenfassung:Nonspherical probe particles are an attractive choice for optically-trapped scanning probe microscopy. We show that it is possible to calibrate a trap with a nonspherical particle using only position measurements, without requiring measurement of orientation, using a pseudopotential based on the position occupation probability. It is not necessary to assume the force is linear with displacement.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.38.001244