Automatic Combination of Multi-tile EBSD Datasets

Electron backscatter diffraction (EBSD) has found extensive use in the field of materials science. Faster acquisition speeds has led to the creation of large datasets using combinations of beam scans and automated stage movements. Stage positioning inaccuracies often lead to missing or duplicated data at tile boundaries. Thus, functions have been implemented to identify grain and phase boundaries in each scan and correlation functions to determine the appropriate offset between adjacent tiles. The advantages and limitations of the method are discussed.