Fast Thin-Film Transistor Circuits Based on Amorphous Oxide Semiconductor
Five-stage ring oscillators (ROs) composed of amorphous In/Ga/Zn/O (a-IGZO) channel thin-film transistors (TFTs) with the channel lengths of 10 mum were fabricated on a glass substrate. The a-IGZO layer was deposited by RF magnetron sputtering onto the unheated substrate. The RO operated at 410 kHz...
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Veröffentlicht in: | IEEE electron device letters 2007-04, Vol.28 (4), p.273-275 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Five-stage ring oscillators (ROs) composed of amorphous In/Ga/Zn/O (a-IGZO) channel thin-film transistors (TFTs) with the channel lengths of 10 mum were fabricated on a glass substrate. The a-IGZO layer was deposited by RF magnetron sputtering onto the unheated substrate. The RO operated at 410 kHz (the propagation delay of 0.24 mus/stage), when supplied with an external voltage of +18 V. This is the fastest integrated circuit based on oxide-semiconductor channel TFTs to date that operates faster than the ROs using conventional hydrogenated amorphous silicon TFTs and organic TFTs |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2007.893223 |