Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface

In this paper, we present the first non-contact atomic force microscopy (nc-AFM) of a silicene on a silver (Ag) surface, obtained by combining non-contact atomic force microscopy and scanning tunneling microscopy (STM). STM images over large areas of silicene grown on the Ag(111) surface show both (...

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Veröffentlicht in:Journal of physics. Condensed matter 2013-06, Vol.25 (22), p.225301-225301
Hauptverfasser: Majzik, Z, Rachid Tchalala, M, Švec, M, Hapala, P, Enriquez, H, Kara, A, Mayne, A J, Dujardin, G, Jelínek, P, Oughaddou, H
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Sprache:eng
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Zusammenfassung:In this paper, we present the first non-contact atomic force microscopy (nc-AFM) of a silicene on a silver (Ag) surface, obtained by combining non-contact atomic force microscopy and scanning tunneling microscopy (STM). STM images over large areas of silicene grown on the Ag(111) surface show both (√13 × √13)R13.9° and (4 × 4) superstructures. For the widely observed (4 × 4) structure, the observed nc-AFM image is very similar to the one recorded by STM. The structure resolved by nc-AFM is compatible with only one out of two silicon atoms being visible. This indicates unambiguously a strong buckling of the silicene honeycomb layer.
ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/25/22/225301