Hard HfB2 tip-coatings for ultrahigh density probe-based storage

Probe-tip mechanical wear is a fundamental issue facing probe-based storage, which can cause serious degradation of the write-read resolution over the device lifetime. HfB2 conductive coatings grown at low temperatures using chemical vapor deposition possess high mechanical properties that are ideal for this technology. Here, we show that HfB2 coated probe-tips can potentially enhance a previously demonstrated 5 km wear endurance mechanism developed using PtIr coated probe-tips to beyond 8 km, thereby increasing the lifetime of probe-based memory devices. We foresee the extension of this coating technology to other scanning probe based systems and nanoelectromechanical devices.