Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer

Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer

We present a spectrometer setup based on grating dispersion for hard x-ray free-electron lasers. This setup consists of a focusing spectrometer grating and a charge-integrating microstrip detector. Measurement results acquired at Linac Coherent Light Source are presented, demonstrating noninvasive m...

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Veröffentlicht in:Optics letters 2012-12, Vol.37 (24), p.5073-5075
Hauptverfasser: Karvinen, Petri, Rutishauser, Simon, Mozzanica, Aldo, Greiffenberg, Dominic, Juranić, Pavle N, Menzel, Andreas, Lutman, Alberto, Krzywinski, Jacek, Fritz, David M, Lemke, Henrik T, Cammarata, Marco, David, Christian
Format: Artikel
Sprache:eng
Schlagworte:
Beams (radiation)
Coherent light
Diffraction gratings
Focusing
Gratings (spectra)
Monitoring
Spectra
Spectrometers
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Beschreibung
Zusammenfassung:We present a spectrometer setup based on grating dispersion for hard x-ray free-electron lasers. This setup consists of a focusing spectrometer grating and a charge-integrating microstrip detector. Measurement results acquired at Linac Coherent Light Source are presented, demonstrating noninvasive monitoring of single-shot spectra with a resolution of 2.0×10(-4) ±0.3×10(-4) at photon energy of 6 keV with more than 95% transmission of the main beam.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.37.005073