Extreme ultraviolet spectra of highly charged xenon observed with an electron beam ion trap

Extreme ultraviolet spectra of highly charged xenon atoms were produced with an electron beam ion trap (EBIT) at the National Institute of Standards and Technology and recorded with a flat-field grazing-incidence spectrometer. The spectra were measured in the wavelength range 4.5-19.5 nm as the beam...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of physics. B, Atomic, molecular, and optical physics Atomic, molecular, and optical physics, 2012-12, Vol.45 (24), p.245001-1-11
Hauptverfasser: Osin, D, Reader, J, Gillaspy, J D, Ralchenko, Yu
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Extreme ultraviolet spectra of highly charged xenon atoms were produced with an electron beam ion trap (EBIT) at the National Institute of Standards and Technology and recorded with a flat-field grazing-incidence spectrometer. The spectra were measured in the wavelength range 4.5-19.5 nm as the beam energy was varied between 1.5 and 5.9 keV. Different ionization stages were enhanced at the various beam energies. Wavelength calibration was provided by spectra of highly charged neon, argon and iron, as well as previously measured lines of highly charged xenon. Identifications of strong n = 3-n = 3 transitions from Ni-like xenon (26+) to Na-like xenon (43+) were determined with the aid of collisional-radiative modelling of the EBIT plasma, which provided good quantitative agreement between simulated and measured spectra. About 50 lines were identified, 30 of which are new. Seven of these lines represent magnetic-dipole transitions within the 3s23pn ground configurations, and one is an electric-quadrupole transition within the 3s23p2 ground configuration of the Si-like ion. A list of adopted wavelengths used as calibration standards is given in the appendix.
ISSN:0953-4075
1361-6455
DOI:10.1088/0953-4075/45/24/245001