Wall-Voltage Stability in AC-PDP Dielectric Barrier Discharges

Wall-Voltage Stability in AC-PDP Dielectric Barrier Discharges

The wall-voltage loss in PDPs with four different types of protective layers, i.e., undoped MgO, Si-doped MgO, Sc-doped MgO, and MgCaO (15%) plasma, are compared. Using a two-electrode opposed-discharge-type PDP, the change in external panel voltage needed to get a new discharge is measured as a fun...

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Veröffentlicht in:IEEE transactions on plasma science 2013-01, Vol.41 (1), p.159-164
Hauptverfasser: Yuxiang Chen, Qing Li, Kai Hu, Wenjian Kuang, Tolner, Harm
Format: Artikel
Sprache:eng
Schlagworte:
Amplification
Comparative analysis
Dielectric barrier
Dielectric relaxation
dielectric-plasma interaction
Dielectrics
Discharges (electric)
Electric potential
Electrodes
Electronics
exoemission
Loss measurement
low-temperature plasma
Magnesium oxide
neon xenon
Partial discharges
Semiconductor doping
Stability
Syntax
Voltage
Voltage measurement
wall voltage
Xenon
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Zusammenfassung:The wall-voltage loss in PDPs with four different types of protective layers, i.e., undoped MgO, Si-doped MgO, Sc-doped MgO, and MgCaO (15%) plasma, are compared. Using a two-electrode opposed-discharge-type PDP, the change in external panel voltage needed to get a new discharge is measured as a function of the waiting time from 5 μs to 50 ms, the number of sustain cycles (1-1024), and the sustain frequency. The results shows that the wall-voltage loss cannot only be caused by amplified exoemission but that dielectric relaxation effects might also play an important role.
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.2012.2227829