Growth of few-layer graphene on SiC at low temperature with the fluorocarbon plasma pre-etching
With the fluorocarbon plasma pre-etching silicon carbide (SiC), a method to prepare few-layer graphene at lower temperature (950°C) by thermal decomposition of SiC was developed. The graphene phase has been found by the X-ray photoelectron spectroscopy and Raman spectroscopy measurement. The planar...
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Veröffentlicht in: | Thin solid films 2013-01, Vol.527, p.65-68 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | With the fluorocarbon plasma pre-etching silicon carbide (SiC), a method to prepare few-layer graphene at lower temperature (950°C) by thermal decomposition of SiC was developed. The graphene phase has been found by the X-ray photoelectron spectroscopy and Raman spectroscopy measurement. The planar sheet of carbon atoms was also observed by atomic force microscopy. The results demonstrate that few-layer graphene can form on SiC substrate at low temperature.
► We studied a method of growing graphene on SiC at low temperature. ► Fluorocarbon plasma pre-etching becomes a key factor in this method. ► Our graphene shows good quality. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2012.12.013 |