Growth of few-layer graphene on SiC at low temperature with the fluorocarbon plasma pre-etching

With the fluorocarbon plasma pre-etching silicon carbide (SiC), a method to prepare few-layer graphene at lower temperature (950°C) by thermal decomposition of SiC was developed. The graphene phase has been found by the X-ray photoelectron spectroscopy and Raman spectroscopy measurement. The planar...

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Veröffentlicht in:Thin solid films 2013-01, Vol.527, p.65-68
Hauptverfasser: Xu, Yijun, Wu, Xuemei, Ye, Chao, Deng, Yanhong, Chen, Tian, Ge, Shuibing
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Sprache:eng
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Zusammenfassung:With the fluorocarbon plasma pre-etching silicon carbide (SiC), a method to prepare few-layer graphene at lower temperature (950°C) by thermal decomposition of SiC was developed. The graphene phase has been found by the X-ray photoelectron spectroscopy and Raman spectroscopy measurement. The planar sheet of carbon atoms was also observed by atomic force microscopy. The results demonstrate that few-layer graphene can form on SiC substrate at low temperature. ► We studied a method of growing graphene on SiC at low temperature. ► Fluorocarbon plasma pre-etching becomes a key factor in this method. ► Our graphene shows good quality.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2012.12.013