Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect

Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode mea...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Optics express 2013-01, Vol.21 (2), p.1417-1429
Hauptverfasser:	Kagawa, Keiichiro, Seo, Min-Woong, Yasutomi, Keita, Terakawa, Susumu, Kawahito, Shoji
Format:	Artikel
Sprache:	eng
Schlagworte:	Equipment Design Equipment Failure Analysis Image Enhancement - instrumentation Lighting - instrumentation Microscopy, Confocal - instrumentation Semiconductors Signal Processing, Computer-Assisted - instrumentation Transducers
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!