Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect

Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect

Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode mea...

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Veröffentlicht in:Optics express 2013-01, Vol.21 (2), p.1417-1429
Hauptverfasser: Kagawa, Keiichiro, Seo, Min-Woong, Yasutomi, Keita, Terakawa, Susumu, Kawahito, Shoji
Format: Artikel
Sprache:eng
Schlagworte:
Equipment Design
Equipment Failure Analysis
Image Enhancement - instrumentation
Lighting - instrumentation
Microscopy, Confocal - instrumentation
Semiconductors
Signal Processing, Computer-Assisted - instrumentation
Transducers
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Beschreibung
Zusammenfassung:Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode measured by FWHM for a planar mirror was 8.9 μm, which showed that the confocality has been achieved with the proposed CMOS image sensor.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.21.001417