Optical and structural properties of calix[4]arene thin films elaborated by pulsed laser deposition

p-tert-butylcalix[4]arene thin films were elaborated by pulsed laser deposition (PLD) using a KrF excimer laser with fluences from 0.13 to 1 J/cm. The conservation of the molecule composition and conformation, as verified by FTIR, is obtained for fluences lower than about 0.45 J/cm. The refractive indices and thicknesses were measured by m-lines spectroscopy. The refractive indices have a step profile and are higher than for films elaborated by thermal evaporation. At higher fluences, the molecule conformation is changed and the step index profile is no longer valid. The effect of annealing on surface morphology and crystallization was studied by AFM and XRD.