Low capacitance CMOS silicon photodetectors for optical clock injection

We have studied the response of CMOS compatible detectors fabricated in a silicon-on-sapphire (SOS) process, operated under short pulse excitation in the blue. These high speed, low capacitance detectors would be suitable for very precise, surface-normal clock injection with silicon CMOS. We charact...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2009-06, Vol.95 (4), p.1129-1135
Hauptverfasser: Latif, S., Kocabas, S. E., Tang, L., Debaes, C., Miller, D. A. B.
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Sprache:eng
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Zusammenfassung:We have studied the response of CMOS compatible detectors fabricated in a silicon-on-sapphire (SOS) process, operated under short pulse excitation in the blue. These high speed, low capacitance detectors would be suitable for very precise, surface-normal clock injection with silicon CMOS. We characterize the capacitance of the detector structure through a combination of experimental techniques and circuit-level and electromagnetic simulations. The transit-time-limited response of the detectors is validated through pump–probe experiments. Detector response times of ∼35 ps have been measured, and devices have capacitance as low as ∼4 fF.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-009-5122-5