Surface enhanced Raman scattering silica substrate fast fabrication by femtosecond laser pulses

Surface enhanced Raman scattering silica substrate fast fabrication by femtosecond laser pulses

We report the fabrication of surface enhanced Raman spectroscopy (SERS) fused silica glass substrates using fast femtosecond-laser (fs-laser) scan, followed by silver chemical plating. A cross-section enhancement factor (EF) of 2.5×10 6 , evaluated by Rhodamine 6G (10 −7  M solution), was obtained....

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2009-11, Vol.97 (3), p.721-724
Hauptverfasser: Han, Yukun, Lan, Xinwei, Wei, Tao, Tsai, Hai-Lung, Xiao, Hai
Format: Artikel
Sprache:eng
Schlagworte:
Characterization and Evaluation of Materials
Condensed Matter Physics
Condensed matter: structure, mechanical and thermal properties
Cross sections (physics)
Exact sciences and technology
Femtosecond
Glass
Lasers
Machines
Manufacturing
Materials science
Nanotechnology
Optical and Electronic Materials
Physics
Physics and Astronomy
Plating
Processes
Raman scattering
Silver
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and Interfaces
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin Films
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Zusammenfassung:We report the fabrication of surface enhanced Raman spectroscopy (SERS) fused silica glass substrates using fast femtosecond-laser (fs-laser) scan, followed by silver chemical plating. A cross-section enhancement factor (EF) of 2.5×10 6 , evaluated by Rhodamine 6G (10 −7  M solution), was obtained. The Raman mapping indicated a good uniformity over the fs-laser scanned area. The dimension and pattern of the SERS activated region can be conveniently controlled by laser 2D scanning, potentially enabling integration of SERS into a high-order optical–chemical analysis system on a glass chip.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-009-5306-z