Influence of line tension on spherical colloidal particles at liquid-vapor interfaces
Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ...
Gespeichert in:
Veröffentlicht in: | Physical review letters 2012-11, Vol.109 (19), p.196101-196101, Article 196101 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ versus R measurements are well described by the modified Young's equation for a line tension τ = 0.93 nN. The AFM measurements are also consistent with a minimum contact angle θ(min) and minimum radius R(min), below which single isolated silica spheres cannot exist at the PS-air interface. |
---|---|
ISSN: | 0031-9007 1079-7114 |
DOI: | 10.1103/physrevlett.109.196101 |