Influence of line tension on spherical colloidal particles at liquid-vapor interfaces

Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physical review letters 2012-11, Vol.109 (19), p.196101-196101, Article 196101
Hauptverfasser: McBride, Sean P, Law, Bruce M
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ versus R measurements are well described by the modified Young's equation for a line tension τ = 0.93 nN. The AFM measurements are also consistent with a minimum contact angle θ(min) and minimum radius R(min), below which single isolated silica spheres cannot exist at the PS-air interface.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.109.196101