Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms

In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shiftregister by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for...

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Veröffentlicht in:	International journal of distributed and parallel systems 2012-07, Vol.3 (4), p.23-23
Hauptverfasser:	Bodean, Ghenadie, Gharibi, Wajeb
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Faults Logic Microcontrollers Nonlinear feedback Registers
Online-Zugang:	Volltext
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