Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique
Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed w...
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| Veröffentlicht in: | Journal of materials science. Materials in electronics 2006-08, Vol.17 (8), p.593-596 |
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| container_issue | 8 |
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| container_title | Journal of materials science. Materials in electronics |
| container_volume | 17 |
| creator | LIMA, John Paul H DE ANDRADE, Adnei M |
| description | Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed. |
| doi_str_mv | 10.1007/s10854-006-0004-5 |
| format | Article |
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Materials in electronics</title><description>Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed.</description><subject>Applied sciences</subject><subject>Atomic force microscopy</subject><subject>Conducting polymers</subject><subject>Deposition</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Materials</subject><subject>Power law</subject><subject>Spin coating</subject><subject>Surface roughness</subject><subject>Thin films</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEURYMoWKs_wF02Ql1E8z2ZpRS_oOJGwV1I06SNpMk4mYLz701pwcXj8eDc--AAcE3wHcG4uS8EK8ERxrIO5kicgAkRDUNc0a9TMMGtaBAXlJ6Di1K-KyM5UxOg33LfbXLM62BNhCaZOJZQYPawy3GcZbR1wyb_jiaFGJK7hcMmJORD3Ba4cl0uYXAruBxh6UKCNpshpDUcnN2k8LNzl-DMm1jc1XFPwefT48f8BS3en1_nDwtkGVYDktRbtVpi20quPFHeO9FatxS0qYfhTHpmmsYIucKEWkepF5wKTlpFadMSNgWzQ2_X5_q2DHobinUxmuTyruiqh5KWyJZVlBxQ2-dSeud114et6ccK6b1MfZCpqyO9l6lFzdwc602pnnxvkg3lP6gwk1Jg9gdV-HVO</recordid><startdate>20060801</startdate><enddate>20060801</enddate><creator>LIMA, John Paul H</creator><creator>DE ANDRADE, Adnei M</creator><general>Springer</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20060801</creationdate><title>Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique</title><author>LIMA, John Paul H ; DE ANDRADE, Adnei M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c308t-62fc8db0c9648f18ffe59ceb52718fa436f3a77a56d012ce22f54254198227913</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Applied sciences</topic><topic>Atomic force microscopy</topic><topic>Conducting polymers</topic><topic>Deposition</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Materials</topic><topic>Power law</topic><topic>Spin coating</topic><topic>Surface roughness</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>LIMA, John Paul H</creatorcontrib><creatorcontrib>DE ANDRADE, Adnei M</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. 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It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed.</abstract><cop>Norwell, MA</cop><pub>Springer</pub><doi>10.1007/s10854-006-0004-5</doi><tpages>4</tpages></addata></record> |
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| ispartof | Journal of materials science. Materials in electronics, 2006-08, Vol.17 (8), p.593-596 |
| issn | 0957-4522 1573-482X |
| language | eng |
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| subjects | Applied sciences Atomic force microscopy Conducting polymers Deposition Electronics Exact sciences and technology Materials Power law Spin coating Surface roughness Thin films |
| title | Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique |
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