Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique

Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique

Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed w...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2006-08, Vol.17 (8), p.593-596
Hauptverfasser: LIMA, John Paul H, DE ANDRADE, Adnei M
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Atomic force microscopy
Conducting polymers
Deposition
Electronics
Exact sciences and technology
Materials
Power law
Spin coating
Surface roughness
Thin films
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Zusammenfassung:Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-006-0004-5