Single event transient pulse attenuation effect in three-transistor inverter chain

In this paper, compared with two-transistor (2T) inverter chain, the production and propagation of P-hit single event transient (SET) in three-transistor (3T) inverter chain is studied in depth based on three-dimensional numerical simulations in a 90 nm bulk complementary metal oxide semiconductor (...

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Veröffentlicht in:Science China. Technological sciences 2012-04, Vol.55 (4), p.867-871
Hauptverfasser: Chen, JianJun, Chen, ShuMing, Liang, Bin, Liu, FanYu
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Sprache:eng
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