Analysis of the stress response of yeast Saccharomyces cerevisiae toward pulsed electric field

This study investigated the stress response of the yeast Saccharomyces cerevisiae toward a pulsed electric field (PEF). Changes in the transcription level of heat stress response gene HSP104 and oxidation stress response genes GSH1, GLR1, SOD1 and SOD2 were analyzed. Comparison of the increases and decreases in the transcript abundance caused by heat and PEF stress showed that these two stresses are different toward yeast. And it was shown that the glutathione-dependent biological defense mechanism against oxidation stress is strongly related to the yeast resistance toward PEF stress. ► The stress response of the yeast toward a pulsed electric field was investigated. ► No heat stress was detected in the PEF-treated yeast cells in our study. ► The PEF treatment induced the expression of the oxidation stress response genes. ► The glutathione played an important role in the stress resistance toward PEF.