Electron injection barriers between air-stable electride with low work function, C12A7:e super(-), and pentacene, C sub(60) and copper phthalocyanine

Electron injection barriers between air-stable electride with low work function, C12A7:e super(-), and pentacene, C sub(60) and copper phthalocyanine

Electron injection barriers (E sub(EIB)) at the interfaces between an air-stable electride with a work function of 3.0 eV, C12A7:e super(-), and organic semiconductor layers were examined by ultraviolet photoelectron spectroscopy. Low E sub(EIB) values were obtained for pentacene (0.8 eV) and C sub(...

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Veröffentlicht in:Journal of materials chemistry 2012-02, Vol.22 (10), p.4278-4281
Hauptverfasser: Yanagi, Hiroshi, Kuroda, Toshifumi, Kim, Ki-Beom, Toda, Yoshitake, Kamiya, Toshio, Hosono, Hideo
Format: Artikel
Sprache:eng
Schlagworte:
Barriers
Buckminsterfullerene
Copper
COPPER PHTHALOCYANINE
FERMI SURFACES
Fullerenes
Organic semiconductors
Pentacene
SEMICONDUCTORS
WORK FUNCTION
Work functions
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Zusammenfassung:Electron injection barriers (E sub(EIB)) at the interfaces between an air-stable electride with a work function of 3.0 eV, C12A7:e super(-), and organic semiconductor layers were examined by ultraviolet photoelectron spectroscopy. Low E sub(EIB) values were obtained for pentacene (0.8 eV) and C sub(60) (0.4 eV), but not for copper phthalocyanine (1.0 eV), suggesting Fermi level pinning. The value of 0.4 eV is the lowest E sub(EIB) for conventional organic semiconductors.
ISSN:0959-9428
1364-5501
DOI:10.1039/c2jm14966d