In situ mechanical characterization of isotropic structures using guided wave propagation

Guided waves are widely used in structural health monitoring (SHM). Their behaviour is highly sensitive to the mechanical properties of a structure. The performance of damage detection strategies based on guided waves therefore relies on an accurate knowledge of the mechanical properties. This paper...

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Veröffentlicht in:Smart materials and structures 2012-06, Vol.21 (6), p.65010-1-9
Hauptverfasser: Ostiguy, Pierre-Claude, Quaegebeur, Nicolas, Mulligan, Kyle R, Masson, Patrice, Elkoun, Saïd
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Sprache:eng
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Zusammenfassung:Guided waves are widely used in structural health monitoring (SHM). Their behaviour is highly sensitive to the mechanical properties of a structure. The performance of damage detection strategies based on guided waves therefore relies on an accurate knowledge of the mechanical properties. This paper presents an integrated characterization technique that identifies the mechanical properties of isotropic structures, namely the elastic modulus and Poisson's ratio. The approach is based on a modified version of an imaging algorithm (Excitelet), where mechanical properties, instead of geometrical scattering features, are set as the variables to be identified. The methodology, accuracy, repeatability, and robustness are assessed, first via a finite element model (FEM) and then experimentally for an aluminum plate with attached piezoceramic (PZT) transducers. The plate is instrumented with two PZTs located 15 cm from each other in a pitch-catch configuration, distant enough to ensure proper mode discrimination. The algorithm accuracy and robustness with respect to slight variations in the geometrical inputs (PZT to PZT distance and thickness of the plate) are validated within ± 1% and ± 2%, respectively, with the FEM. Experimental results are validated within ± 1% of supplier properties, demonstrating the ability of this approach to allow accurate characterization of a structure in situ without the need for complex and expensive devices or ASTM testing.
ISSN:0964-1726
1361-665X
DOI:10.1088/0964-1726/21/6/065010