Direct measurements of exciton diffusion length limitations on organic solar cell performance

Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC(71)BM solar cells. We can predict device performance from X-ray structural data th...

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Veröffentlicht in:Chemical communications (Cambridge, England) England), 2012-06, Vol.48 (47), p.5859-5861
Hauptverfasser: Kozub, Derek R, Vakhshouri, Kiarash, Kesava, Sameer Vajjala, Wang, Cheng, Hexemer, Alexander, Gomez, Enrique D
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container_issue 47
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container_title Chemical communications (Cambridge, England)
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creator Kozub, Derek R
Vakhshouri, Kiarash
Kesava, Sameer Vajjala
Wang, Cheng
Hexemer, Alexander
Gomez, Enrique D
description Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC(71)BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.
doi_str_mv 10.1039/c2cc31925j
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source Royal Society Of Chemistry Journals; Alma/SFX Local Collection
subjects Devices
Diffusion length
Excitation
Mathematical models
Photovoltaic cells
Scattering
Solar cells
X-rays
title Direct measurements of exciton diffusion length limitations on organic solar cell performance
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