Direct measurements of exciton diffusion length limitations on organic solar cell performance

Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC(71)BM solar cells. We can predict device performance from X-ray structural data th...

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Veröffentlicht in:Chemical communications (Cambridge, England) England), 2012-06, Vol.48 (47), p.5859-5861
Hauptverfasser: Kozub, Derek R, Vakhshouri, Kiarash, Kesava, Sameer Vajjala, Wang, Cheng, Hexemer, Alexander, Gomez, Enrique D
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Sprache:eng
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Zusammenfassung:Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC(71)BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.
ISSN:1359-7345
1364-548X
DOI:10.1039/c2cc31925j