X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer
The application of a two dimensional (2D) grating interferometer-Fresnel zone plate combination for quantitative submicron phase contrast imaging is reported. The combination of the two optical elements allows quick recovery of the phase shift introduced by a sample in a hard X-ray beam, avoiding ar...
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Veröffentlicht in: | Optics letters 2012-05, Vol.37 (10), p.1622-1624 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The application of a two dimensional (2D) grating interferometer-Fresnel zone plate combination for quantitative submicron phase contrast imaging is reported. The combination of the two optical elements allows quick recovery of the phase shift introduced by a sample in a hard X-ray beam, avoiding artifacts observed when using the one dimensional (1D) interferometer for a sample with features oriented in the unsensitive direction of the interferometer. The setup provides submicron resolution due to the optics magnification ratio and a fine sensitivity in both transverse orientations due to the 2D analysis gratings. The method opens up possibilities for sub-micro phase contrast tomography of microscopic objects made of light and/or homogeneous materials with randomly oriented features. |
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ISSN: | 0146-9592 1539-4794 |
DOI: | 10.1364/OL.37.001622 |