Measurement systems for the investigation of soldering quality in high-power diode laser bars

Thermal and spatial-spectral imaging methods are used to investigate the soldering quality in high-power laser-bar devices. The temperature distribution and the wavelength profile across a driven laser bar correlate with the local thermal resistance between laser and cooler and, thus, with the unifo...

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Veröffentlicht in:	Journal of lightwave technology 2005-11, Vol.23 (11), p.3889-3892
Hauptverfasser:	Troger, J., Schwarz, M., Jakubowicz, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Bars Correlation Devices Diode lasers Exact sciences and technology Fundamental areas of phenomenology (including applications) Gratings Illustrations imaging Lasers Operation, maintenance, reliability Optical imaging Optical microscopy Optics photothermal effects Physics Pump lasers Semiconductor laser arrays Semiconductor lasers laser diodes Soldering Systems, networks and services of telecommunications Telecommunications Telecommunications and information theory Temperature distribution Thermal resistance Variability Wavelength measurement Wavelengths
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Beschreibung
Zusammenfassung:	Thermal and spatial-spectral imaging methods are used to investigate the soldering quality in high-power laser-bar devices. The temperature distribution and the wavelength profile across a driven laser bar correlate with the local thermal resistance between laser and cooler and, thus, with the uniformity of the solder layers. Measurements with a properly soldered and a deficiently soldered laser bar are made for the illustration and comparison of the methods.
ISSN:	0733-8724 1558-2213
DOI:	10.1109/JLT.2005.857757