Structural analysis of chemically deposited nanocrystalline PbS films

Nanocrystalline PbS films are deposited on glass substrates by chemical bath deposition technique at room temperature. The structural parameters of PbS nanoparticles are studied by X-ray line profile analysis using Williamson-Hall and modified Williamson-Hall plot. The values of average crystallite...

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Veröffentlicht in:	Thin solid films 2011-01, Vol.519 (7), p.2132-2134
Hauptverfasser:	Choudhury, N., Sarma, B.K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemical bath deposition Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Crystallites Defects and impurities: doping, implantation, distribution, concentration, etc Deposition Dislocation density Exact sciences and technology Lead sulfide Liquid phase epitaxy deposition from liquid phases (melts, solutions, and surface layers on liquids) Materials science Methods of deposition of films and coatings film growth and epitaxy Nanocrystalline films Nanocrystals Nanoparticles Nanoscale materials and structures: fabrication and characterization Other topics in nanoscale materials and structures Physics Structural analysis Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films Williamson-Hall plots X-ray diffraction X-rays
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Beschreibung
Zusammenfassung:	Nanocrystalline PbS films are deposited on glass substrates by chemical bath deposition technique at room temperature. The structural parameters of PbS nanoparticles are studied by X-ray line profile analysis using Williamson-Hall and modified Williamson-Hall plot. The values of average crystallite sizes are found to vary from 12 to 18 nm having very high dislocation density of the order of 10 17 m −2.
ISSN:	0040-6090 1879-2731
DOI:	10.1016/j.tsf.2010.11.003