SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument
A hollow‐core photonic band‐gap fiber exposed to Rb vapor was studied using quadrupole‐based SIMS. The Rb concentration along 30‐cm fibers was analyzed using a Cs+ beam. Effective charge compensation was obtained in the fiber cross‐section without using any metal coating. A low Rb detection limit of...
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| Veröffentlicht in: | Surface and interface analysis 2011-01, Vol.43 (1-2), p.566-568 |
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| container_title | Surface and interface analysis |
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| creator | Guryanov, G. M. Slepkov, A. D. Gaeta, A. L. Koch, K. W. |
| description | A hollow‐core photonic band‐gap fiber exposed to Rb vapor was studied using quadrupole‐based SIMS. The Rb concentration along 30‐cm fibers was analyzed using a Cs+ beam. Effective charge compensation was obtained in the fiber cross‐section without using any metal coating. A low Rb detection limit of about 6 × 1015 atoms/cm3 was obtained in the silica microstructure region of the fiber. SIMS results revealed variations in the longitudinal distribution of Rb in fibers exposed to different loading conditions. Ion imaging of the fiber cross‐section using a Ga+ beam revealed the confinement of Rb atoms to the microstructured photonic region of the fiber, as opposed to the solid glass cladding. Copyright © 2010 John Wiley & Sons, Ltd. |
| doi_str_mv | 10.1002/sia.3552 |
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M.</creatorcontrib><creatorcontrib>Slepkov, A. D.</creatorcontrib><creatorcontrib>Gaeta, A. L.</creatorcontrib><creatorcontrib>Koch, K. W.</creatorcontrib><title>SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument</title><title>Surface and interface analysis</title><addtitle>Surf. Interface Anal</addtitle><description>A hollow‐core photonic band‐gap fiber exposed to Rb vapor was studied using quadrupole‐based SIMS. The Rb concentration along 30‐cm fibers was analyzed using a Cs+ beam. Effective charge compensation was obtained in the fiber cross‐section without using any metal coating. A low Rb detection limit of about 6 × 1015 atoms/cm3 was obtained in the silica microstructure region of the fiber. SIMS results revealed variations in the longitudinal distribution of Rb in fibers exposed to different loading conditions. Ion imaging of the fiber cross‐section using a Ga+ beam revealed the confinement of Rb atoms to the microstructured photonic region of the fiber, as opposed to the solid glass cladding. Copyright © 2010 John Wiley & Sons, Ltd.</description><subject>Atomic, molecular, and ion beam impact and interactions with surfaces</subject><subject>Beams (radiation)</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross sections</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>Exact sciences and technology</subject><subject>Exposure</subject><subject>FIB imaging</subject><subject>Fibers</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>hollow-core photonic band-gap fiber</subject><subject>Impact phenomena (including electron spectra and sputtering)</subject><subject>Interface analysis</subject><subject>Optical materials</subject><subject>Optics</subject><subject>Photonic bandgap materials</subject><subject>Photonics</subject><subject>Physics</subject><subject>Rb quantification</subject><subject>Secondary ion mass spectrometry</subject><subject>Silicon dioxide</subject><subject>SIMS</subject><issn>0142-2421</issn><issn>1096-9918</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp10EtPGzEUhmGraqWmFKk_wRskNgbfxuNZRimXSKSVmgLdWWdsDxic8WBPBPn3HUREV12dzaNXOh9C3xg9YZTy0xLgRFQV_4BmjDaKNA3TH9GMMskJl5x9Rl9KeaCUaqHVDNn1crXG0EPclVBw6vCvlrg0eIfvU4zpmdiUPR7u05j6YHELvSN3MOASYrCAu9D6jLcl9HcY8GK-OlvMsawqikNfxrzd-H78ij51EIs_3N8DdH1-9ntxSa5-XiwX8ytiBa85ccJp2XhwHbNCMl_7RmhXc6eZFEK5tmWa8dZZV3USnLVKeNspD9ILIepKHKDjt-6Q09PWl9FsQrE-Ruh92hbDKOda1Urzf9TmVEr2nRly2EDeTci87mimHc3rjhM92lehWIhdht6G8u65qBst62Zy5M09h-h3_-2Z9XK-7-59KKN_efeQH42qp3fM7Y8Lc1N9_3O7qpS5EX8BfC-PCw</recordid><startdate>201101</startdate><enddate>201101</enddate><creator>Guryanov, G. 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Interface Anal</addtitle><date>2011-01</date><risdate>2011</risdate><volume>43</volume><issue>1-2</issue><spage>566</spage><epage>568</epage><pages>566-568</pages><issn>0142-2421</issn><issn>1096-9918</issn><eissn>1096-9918</eissn><coden>SIANDQ</coden><abstract>A hollow‐core photonic band‐gap fiber exposed to Rb vapor was studied using quadrupole‐based SIMS. The Rb concentration along 30‐cm fibers was analyzed using a Cs+ beam. Effective charge compensation was obtained in the fiber cross‐section without using any metal coating. A low Rb detection limit of about 6 × 1015 atoms/cm3 was obtained in the silica microstructure region of the fiber. SIMS results revealed variations in the longitudinal distribution of Rb in fibers exposed to different loading conditions. Ion imaging of the fiber cross‐section using a Ga+ beam revealed the confinement of Rb atoms to the microstructured photonic region of the fiber, as opposed to the solid glass cladding. 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| ispartof | Surface and interface analysis, 2011-01, Vol.43 (1-2), p.566-568 |
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| subjects | Atomic, molecular, and ion beam impact and interactions with surfaces Beams (radiation) Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross sections Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Exposure FIB imaging Fibers Fundamental areas of phenomenology (including applications) hollow-core photonic band-gap fiber Impact phenomena (including electron spectra and sputtering) Interface analysis Optical materials Optics Photonic bandgap materials Photonics Physics Rb quantification Secondary ion mass spectrometry Silicon dioxide SIMS |
| title | SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument |
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