SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument

SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument

A hollow‐core photonic band‐gap fiber exposed to Rb vapor was studied using quadrupole‐based SIMS. The Rb concentration along 30‐cm fibers was analyzed using a Cs+ beam. Effective charge compensation was obtained in the fiber cross‐section without using any metal coating. A low Rb detection limit of...

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Veröffentlicht in:Surface and interface analysis 2011-01, Vol.43 (1-2), p.566-568
Hauptverfasser: Guryanov, G. M., Slepkov, A. D., Gaeta, A. L., Koch, K. W.
Format: Artikel
Sprache:eng
Schlagworte:
Atomic, molecular, and ion beam impact and interactions with surfaces
Beams (radiation)
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross sections
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Exposure
FIB imaging
Fibers
Fundamental areas of phenomenology (including applications)
hollow-core photonic band-gap fiber
Impact phenomena (including electron spectra and sputtering)
Interface analysis
Optical materials
Optics
Photonic bandgap materials
Photonics
Physics
Rb quantification
Secondary ion mass spectrometry
Silicon dioxide
SIMS
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Zusammenfassung:A hollow‐core photonic band‐gap fiber exposed to Rb vapor was studied using quadrupole‐based SIMS. The Rb concentration along 30‐cm fibers was analyzed using a Cs+ beam. Effective charge compensation was obtained in the fiber cross‐section without using any metal coating. A low Rb detection limit of about 6 × 1015 atoms/cm3 was obtained in the silica microstructure region of the fiber. SIMS results revealed variations in the longitudinal distribution of Rb in fibers exposed to different loading conditions. Ion imaging of the fiber cross‐section using a Ga+ beam revealed the confinement of Rb atoms to the microstructured photonic region of the fiber, as opposed to the solid glass cladding. Copyright © 2010 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
1096-9918
DOI:10.1002/sia.3552