32Si AMS measurement with Δ E-Q3D method

32Si AMS measurement with Δ E-Q3D method

Accelerator mass spectrometry (AMS) is one of the most promising methods for the measurement of trace amount of 32Si for its advantages of small sample size, short measurement time and extremely high sensitivity. However, the isobaric interference from 32S often badly hinders the AMS measurement of...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2011-12, Vol.269 (23), p.2745-2749
Hauptverfasser: Gong, Jie, Li, Chaoli, Wang, Wei, Zheng, Guowen, Hu, Hao, He, Ming, Jiang, Shan
Format: Artikel
Sprache:eng
Schlagworte:
32Si
Accelerator mass spectrometry (AMS)
Accelerators
Beam interactions
Blanks
Interference
Isobaric suppression
Mass spectrometry
Radiation
Silicon
Ultra-sensitive measurement
Δ E-Q3D
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Zusammenfassung:Accelerator mass spectrometry (AMS) is one of the most promising methods for the measurement of trace amount of 32Si for its advantages of small sample size, short measurement time and extremely high sensitivity. However, the isobaric interference from 32S often badly hinders the AMS measurement of 32Si. The Δ E-Q3D detection technique established in this work brought about an overall suppression factor of larger than 10 12 for 32S. As a result, a sensitivity of better than 1 × 10 −14 ( 32Si/Si) has been achieved, based on the measurement of a blank sample.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2011.08.026