Scan-Based Tests with Low Switching Activity

Supply current and power dissipation during scan-based test can be far higher than during normal circuit operation because of increased switching activity caused by the tests. In this paper, we propose a method that fills unspecified entries in test cubes to reduce the switching activity caused by s...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE design & test of computers 2007-05, Vol.24 (3), p.268-275
Hauptverfasser:	Remersaro, S., Xijiang Lin, Reddy, S.M., Pomeranz, I., Rajski, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit faults Circuit testing Clocks Cubes Current supplies Electric circuits Graphics Hardware Lab-on-a-chip Logic testing Power dissipation Power supplies scan shift scan-based test supply current Switching switching activity Switching circuits test response capture
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Supply current and power dissipation during scan-based test can be far higher than during normal circuit operation because of increased switching activity caused by the tests. In this paper, we propose a method that fills unspecified entries in test cubes to reduce the switching activity caused by scan tests simultaneously during the scan-shift and capture cycles. Our method doesn't require additional hardware or modifications to the scan chains.
ISSN:	0740-7475 2168-2356 1558-1918 2168-2364
DOI:	10.1109/MDT.2007.80