Optoelectronic method of contactless reconstruction of the surface profile of complexly shaped three-dimensional objects

An optoelectronic method of contactless reconstruction of the surface profile of complexly shaped threedimensional objects with the use of structured light, phase triangulation, and a steady-state method of identification of interference patterns by means of stepwise shift is considered. Analytic es...

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Veröffentlicht in:	Measurement techniques 2010-10, Vol.53 (6), p.648-656
Hauptverfasser:	Dvoynishnikov, S. V., Kulikov, D. V., Meledin, V. G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analysis Analytical Chemistry Characterization and Evaluation of Materials Error analysis Estimates Identification Interference Light Linear and Angular Measurements Mathematical analysis Measurement Science and Instrumentation Measurement techniques Methods Optoelectronics Optoelectronics industry Phase shift Physical Chemistry Physics Physics and Astronomy Reconstruction Three dimensional
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Beschreibung
Zusammenfassung:	An optoelectronic method of contactless reconstruction of the surface profile of complexly shaped threedimensional objects with the use of structured light, phase triangulation, and a steady-state method of identification of interference patterns by means of stepwise shift is considered. Analytic estimates as well as estimates obtained experimentally (using the newly developed measurement system) of the error in measurements of surface profile with the use of the proposed method are presented.
ISSN:	0543-1972 1573-8906
DOI:	10.1007/s11018-010-9556-0