A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

The microstructures of continuously processed YBa/sub 2/Cu/sub 3/O/sub y/ (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y/sub...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.3359-3364
Hauptverfasser: Holesinger, T.G., Foltyn, S.R., Arendt, P.N., Quanxi Jia, Dowden, P.C., DePaula, R.F., Groves, J.R.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Buffer layers
COATINGS
Conducting materials
Conductors
COPPER OXIDE
DEPOSITION
Electric connection. Cables. Wiring
ELECTRICAL CONDUCTORS
Electrical engineering. Electrical power engineering
Exact sciences and technology
Interface reactions
INTERFACES
Ion beam assisted deposition
Lattices
MATHEMATICAL ANALYSIS
Microstructure
MICROSTRUCTURES
Optical pulses
Pulsed laser deposition
Substrates
Superconducting films
SUPERCONDUCTORS
Various equipment and components
YBCO superconductors
Yttria stabilized zirconia
Yttrium barium copper oxide
YTTRIUM OXIDE
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The microstructures of continuously processed YBa/sub 2/Cu/sub 3/O/sub y/ (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y/sub 2/O/sub 3/ or CeO/sub 2/. Different interfacial reactions were observed in each case. The volume changes that occur with the interfacial reactions were calculated based on the identified reaction products. The calculated volume changes correlate with the observed microstructures and appear to be an important factor in determining an optimal buffer layer system. The interfacial reactions do not preclude the attainment of high I/sub c/ and J/sub c/ values in these coated conductors.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.919783