Reconstruction of Closely Spaced Small Inclusions

In this paper we establish an explicit asymptotic formula for the steady state voltage perturbations caused by closely spaced small conductivity inhomogeneities. Based on this new formula we design a very effective numerical method to identify the location and some geometric features of these inhomo...

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Veröffentlicht in:SIAM journal on numerical analysis 2005-01, Vol.42 (6), p.2408-2428
Hauptverfasser: Ammari, Habib, Kang, Hyeonbae, Eunjoo Kim, Mikyoung Lim
Format: Artikel
Sprache:eng
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Zusammenfassung:In this paper we establish an explicit asymptotic formula for the steady state voltage perturbations caused by closely spaced small conductivity inhomogeneities. Based on this new formula we design a very effective numerical method to identify the location and some geometric features of these inhomogeneities from a finite number of boundary measurements. The viability of our approach is documented by numerical examples.
ISSN:0036-1429
1095-7170
DOI:10.1137/s0036142903422752