Role of zinc in CdZnTe radiation detectors
CdZnTe (CZT) crystals grown with Zn compositions of 0%, 10%, 15%, and 20% have been grown and detectors have been produced. Infrared transmissions measured on the wafers sliced from these crystals show that as the Zn composition increases, there is a reduction in the transmission toward longer wavel...
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Veröffentlicht in: | IEEE transactions on nuclear science 2004-10, Vol.51 (5), p.2405-2411 |
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Zusammenfassung: | CdZnTe (CZT) crystals grown with Zn compositions of 0%, 10%, 15%, and 20% have been grown and detectors have been produced. Infrared transmissions measured on the wafers sliced from these crystals show that as the Zn composition increases, there is a reduction in the transmission toward longer wavelengths, indicating the existence of an increasing amount of larger Te-inclusions. For producing high resistivity materials, a higher concentration of indium is also required for CZT with higher Zn composition. The best detectors were produced in CZT with 10% Zn, while CdTe detectors are unable to resolve the /sup 57/Co 122-keV peak. CZT detectors with 15% and 20% Zn in the melt display high counts at energies below this peak. The above results are explained by a model that the role of Zn in CZT is to reduce the density of Te antisites (Te/sub Cd/), to increase the density of V/sub Cd/, and to enhance the diffusion rate of V/sub Cd/. The higher amount of Te-inclusions in CZT with more Zn is caused by the rapid merge of V/sub Cd/ through fast diffusion. Because of the trapping by the Te-inclusions, detectors fabricated on CZT with 15% and 20% Zn are inferior to the 10% Zn CZT detectors. On the other hand, CdTe and CZT with Zn composition less than 7% Zn have a high concentration of Te/sub Cd/,V/sub Cd/, and complexes such as Te/sub Cd//spl middot/V/sub Cd/ and Te/sub Cd//spl middot/(V/sub Cd/)/sup 2/, which are also trapping centers. As a result, the detectors fabricated on these crystals are also inferior to the 10% Zn detectors. The optimal Zn content for CZT grown using our technique is therefore near 10%. |
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ISSN: | 0018-9499 1558-1578 |
DOI: | 10.1109/TNS.2004.835613 |