Nd: Bi4Ge3O12 crystal growth by czochralski method
Nd-doped Bi4Ge3O12 (Nd:BGO) crystals were successfully grown in the auto-diameter control system equipped with a frequency weighing sensor with the Czochralski method. The Nd3+ ion doping level was varied from 0.25 to 2.5 at.%. The crystals were transparent and of light purple color, with a typical...
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Veröffentlicht in: | Metals and materials (Seoul, Korea) Korea), 1999-10, Vol.5 (5), p.491-495 |
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Sprache: | eng |
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Zusammenfassung: | Nd-doped Bi4Ge3O12 (Nd:BGO) crystals were successfully grown in the auto-diameter control system equipped with a frequency weighing sensor with the Czochralski method. The Nd3+ ion doping level was varied from 0.25 to 2.5 at.%. The crystals were transparent and of light purple color, with a typical size of about 20 mm in diameter and 50 mm in length. The effective distribution coefficient (keff) of Nd3+ ion was about 0.957 irrespective of concentration, and the Nd3+ ions were distributed homogeneously throughout the crystal. The doping concentration (pi) of active ion in Nd:BGO crystal was 2.54x1020 ions/cm3, which is higher than that in the Nd:YAG crystal. Therefore, the Nd:BGO crystal was judged to be more suitable for the laser diode pumping microchip laser material where size reduction was desirable. |
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ISSN: | 1225-9438 1598-9623 2005-4149 |
DOI: | 10.1007/BF03026164 |